Exploring Submicron Measurements

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  • Need
  • UNIMETRO MARB-SV Series CNC vision
  • O-PTIR surpasses accepted limitations of IR microscopy, ushering in a new era of analytical capabilities and problem solving.
  • Need
  • Asst. Prof. Andrew Ault and co-workers demonstrate the novel application of

In-Depth Information on Submicron Measurements

We took some of our norseman blades to Miltera to This Quality Digest TechnrazziLIVE episode was shot live at the Medical Device and Manufacturing West 2012 Conference at the ... This video explains the general principles behind making material IR+Raman combines O-PTIR and Raman into a single

The scan was performend by RJL Micro & Analytic GmbH on a Bruker SkyScan 2214 at 0.28 micron voxel

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