Exploring Wafer Map Failure Pattern Classification Using Deep Learning
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Stanford graduate school class CS230 Fall 2019 Project, by SCPD students, Jie and Chen, Stanford graduate school class CS230 Fall 2019 Project, by SCPD students, Jie and Chen, Hello my name is adam faskowitz and i will be giving a tutorial on how to Reference Number: 1982 Title: Development of Intelligent
298B Group5 Used WM811K and WM38 dataset. Merged them and annotated the
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